Early Prediction of Product Performance and Yield Via Technology Benchmark
Choongyeun Cho, Daeik Kim, Jonghae Kim, Daihyun Lim, and Sangyeun Cho
IEEE Custom Integrated Circuits Conference (CICC) 2008, Sep 2008
Abstract
This paper presents a practical method to estimate IC product performance and parametric yield solely from a well-chosen set of existing electrical measurements intended for technology monitoring at an early stage of manufacturing. We demonstrate that the components of mmWave PLL and productlike logic performance in a 65nm SOI CMOS technology are predicted within a 5% RMS error relative to mean.Download
PDF file, slides<<Go back to the previous page
The papers in this page are provided as courtesy and are presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. Other restrictions to copying individual documents may apply.