Scalable Statistical Measurement and Estimation of a mm-Wave CML Static Divider Sensitivity in 65nm SOI CMOS
Daeik Kim, Choongyeun Cho, and Jonghae Kim
IEEE RFIC Symposium 2008, June 2008
Abstract
A CML static divider operates up to 82.4GHz with 90% yield for 0dBm input is statistically measured and estimated. The proposed method of statistical measurement enables reliable sensitivity curve estimation by 55% of standard variation, based on the analytic model, simulations, and scalable DC and RF measurements for the first time. A 300mm full wafer is scanned for the validation.Download
PDF file<<Go back to the previous page
The papers in this page are provided as courtesy and are presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. Other restrictions to copying individual documents may apply.